X-ray Diffractometer (XRD)

X-ray diffractometer (XRD) is currently one of the most powerful methods for studying crystal structure. XRD is particularly suitable for phase analysis of crystalline materials. By examining a sample’s X-ray diffraction pattern and comparing it with the X-ray diffraction patterns of known crystalline materials, qualitative identification of the sample’s phase composition and structure can be achieved. Analyzing and calculating data such as the sample’s diffraction intensity allows for quantitative analysis of the sample’s phase composition.

XRD can also determine the size and arrangement of crystal grains, measure stress, generate rocking curves, reciprocal space diagrams, and accurately determine crystallinity and unit cell parameters within materials.