- Tel：+86 0755-28329695 / +86 0510-85590779
- Email：info@kahkee-instrument.com
X射线衍射仪（X-ray diffractometer，简称XRD）是目前研究晶体结构最有力的方法之一。XRD特别适用于晶态物质的物相分析，通过检查样品的X射线衍射图以及与已知的晶态物质的X射线衍射图谱的对比，可完成对样品物相组成和结构的定性鉴定。通过对样品衍射强度等数据的分析计算，可以完成样品物相组成的定量分析。
XRD还可测定材料中晶粒的大小及排布取向、材料中的应力测量、摇摆曲线、倒易空间图、结晶度、晶胞参数的精确测定等。
| Item | Specifications |
|---|---|
| Dimensions | 1300 (W) × 1880 (H) × 1300 (D) mm |
| X-ray tube | Power: 2.2 kW, voltage: 10–60 kV, current: 0–50 mA |
| Target: Cu, anode grounded, Beryllium Window: 300 μm | |
| Electron beam focal spot: 0.4 × 1.2 mm | |
| Water cooling: Minimum flow rate: 3.5 l/min, maximum water pressure: 490 kPa, pressure drop: 98 kPa | |
| High-voltage power supply | Input: voltage 230 Vac – 10%, one phase, current 33 A |
| Output: voltage 0-60 kV, current 0-80 mA | |
| Stability: < 0.01% voltage and current variation within 8 hours after a 1-hour warm-up period | |
| Ripple: 0.03% rms below 1 kHz; 0.75% above 1 kHz rms | |
| Goniometer | Type: Vertically positioned goniometer |
| Angle range: -110°~ +168° | |
| Angle positioning: Stepper motor + optical encoder | |
| Minimum step size: 0.0001°, positioning accuracy: < 0.0005° |
| Item | Specifications |
|---|---|
| Detector | Type: Photon counter detector (2D) |
| Active area: 77.1×38.4 = 2961 mm2 | |
| Pixel size: 75×75 μm | |
| Size: 100×140×93 mm3 | |
| Sample stage | Standard sample stage: Rx, Ry, Z, Phi |
| XYZ motion stage (optional): X, Y, Z | |
| Capillary sample stage (optional): X, Y, Phi | |
| Five-axis sample stage (optional): X, Y, Z, Phi, Chi | |
| Non-ambient sample stage (optional) | |
| Optical elements | Variable slit: 0.05 – 10 mm |
| Soller Slits: 0.5°, 0.2°, 0.1°, 0.05°, 0.02° | |
| Goebel mirror: Divergence 0.03°, f1 = 100 mm, monochromaticity Kα | |
| Double crystal monochromator: Ge220×2 |
Address: No. 1, Jikang Road, Kengzi Subdistrict, Pingshan District, Shenzhen, Guangdong Province
Hotline: +86 0755-28329695 / +86 0510-85590779
Email: info@kahkee-instrument.com
