- Tel：+86 0755-28329695 / +86 0510-85590779
- Email：info@kahkee-instrument.com
SUEM is a scanning electron microscope technology that enables high-resolution imaging and analysis of samples in an extremely short time, enabling the observation of rapid dynamic processes.
It features ultra-high temporal resolution, high spatial resolution, real-time dynamic observation, and multimodal imaging.
| Category | Item | Thermal emission mode | In-situ mode | Photoemission mode |
|---|---|---|---|---|
| Key parameters | Spatial resolution | 3 nm@30 kV | 3 nm@30 kV | < 10 nm @30 kV |
| Temporal resolution | — | — | 1 ps @30 kV | |
| Accelerating voltage | 500 V ~ 30 kV | 500 V ~ 30 kV | 500 V ~ 30 kV | |
| Filament | Lanthanum hexaboride | |||
| Detector | In-column electron detector | Conventional SE detector | Laser-shielded SE detector | |
| Laser shielding efficiency | >99.8% | |||
| Sample chamber | Camera | Infrared monitoring camera | ||
| Sample stage | Five-axis stage, multi-physics excitation stage, compatible with TEM multi-physics stages, transport measurements | |||
| Laser parameters | Wavelength | Probe (257.5 nm, 355 nm), Pump (355 nm, 515 nm, 1030 nm) | ||
| Pulse width | 300 fs | |||
| Repetition rate | 5 kHz ~ 5 MHz (continuously adjustable) | |||
| Energy | 40 uJ @5 MHz | |||
| Laser spot size | Probe (FHWM: 40 um), Pump (FHWM: 40 um) | |||
| Laser incident angle | 0~60° (multiple variables) | |||
| Software | Automatic time-resolved data acquisition and processing | |||
| Key parameters | Spatial resolution | 3 nm@30 kV | 3 nm@30 kV | < 10 nm @30 kV |
Address: No. 1, Jikang Road, Kengzi Subdistrict, Pingshan District, Shenzhen, Guangdong Province
Hotline: +86 0755-28329695 / +86 0510-85590779
Email: info@kahkee-instrument.com
